REDUCED ELECTROMIGRATION AND STRESS INDUCED MIGRATION OF CU WIRES BY SURFACE COATING
HU, CHAO-KUN, SAMBUCETTI, CARLOS, J, STAMPER, ANTHONY, K, RUBINO, JUDITH, M, ROSENBERG, ROBERT
Year of Publication 05.06.2002
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Year of Publication 05.06.2002
Patent
REDUCED ELECTROMIGRATION AND STRESS INDUCED MIGRATION OF Cu WIRES BY SURFACE COATING
HU, CHAO-KUN, SAMBUCETTI, CARLOS, J, STAMPER, ANTHONY, K, RUBINO, JUDITH, M, ROSENBERG, ROBERT
Year of Publication 01.02.2001
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Year of Publication 01.02.2001
Patent