A ring circuit for the determination of dynamic error rates in high-temperature superconductor RSFQ circuits
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Journal Article
Conference Proceeding
Measurement of the error rate of single flux quantum circuits with high temperature superconductors
Ruck, B., Yonuk Chong, Dittmann, R., Engelhardt, A., Oelze, B., Sodtke, E., Siegel, M., Booij, W.E., Blamire, M.G.
Published in IEEE transactions on applied superconductivity (01.06.1999)
Published in IEEE transactions on applied superconductivity (01.06.1999)
Get full text
Journal Article
Conference Proceeding