Electrochemical Reliability as a Function of Component Standoff
Bixenman, Mike, McMeen, Mark
Published in 2020 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2020)
Published in 2020 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2020)
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Conference Proceeding
Real-time Reliability Testing Advancements on Production Electronic Hardware
Bixenman, Mike, McMeen, Mark
Published in 2019 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2019)
Published in 2019 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2019)
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Conference Proceeding
Reliable micro-electronic assembly process design test methods - a non-standard approach
Bixenman, Mike, McMeen, Mark, Tynes, Jason
Published in 2017 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2017)
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Published in 2017 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2017)
Conference Proceeding
ION chromatography component specific cleanliness testing for process acceptability
Bixenman, Mike, Lober, David, McMeen, Mark, Langley, Collin
Published in 2018 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2018)
Published in 2018 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2018)
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Conference Proceeding
Cleanliness testing for process acceptability
McMeen, Mark, Johnson, Jonnie, Langley, Collin, Bixenman, Mike, Lober, David
Published in 2018 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2018)
Published in 2018 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2018)
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Conference Proceeding
ELECTRONIC CIRCUIT BOARD TESTING SYSTEM
Perigen, James, Forsythe, Thomas M, Bixenman, Michael L, McMeen, Mark, Glidwell, Bobby, Langley, Colin
Year of Publication 27.07.2023
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Year of Publication 27.07.2023
Patent
ELECTRONIC CIRCUIT BOARD TESTING SYSTEM
LANGLEY, Colin, PERIGEN, James, GLIDWELL, Bobby, MCMEEN, Mark, FORSYTHE, Thomas, BIXENMAN, Michael
Year of Publication 27.07.2023
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Year of Publication 27.07.2023
Patent
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
BIXENMAN, MICHAEL L, LOBER, DAVID T, MCMEEN, MARK TAYLOR, TYNES, JASON EDWARD
Year of Publication 28.12.2022
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Year of Publication 28.12.2022
Patent
SYSTEM FOR MONITORING ELECTROCHEMICAL RELIABILITY OF AN ELECTRONIC ASSEMBLY
BIXENMAN, Michael L, MCMEEN, Mark Taylor, LOBER, David T, TYNES, Jason Edward
Year of Publication 27.10.2021
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Year of Publication 27.10.2021
Patent
Characterizing materials at the component interface can improve reliability
Bixenman, Mike, Lober, David, McMeen, Mark, Tynes, Jason
Published in 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.01.2016)
Published in 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.01.2016)
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Conference Proceeding
Electronic assembly warranties challenge the industry to improve risk mitigation test methods
McMeen, Mark, Tynes, Jason, Bixenman, Mike, Lober, David
Published in 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.01.2016)
Published in 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.01.2016)
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Conference Proceeding
System and method for electrical circuit monitoring
Lober, David T, McMeen, Mark Taylor, Bixenman, Michael L, Tynes, Jason Edward
Year of Publication 27.07.2021
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Year of Publication 27.07.2021
Patent
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
Lober, David T, McMeen, Mark Taylor, Bixenman, Michael L, Tynes, Jason Edward
Year of Publication 20.08.2020
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Year of Publication 20.08.2020
Patent
System and method for electrical circuit monitoring
Lober, David T, McMeen, Mark Taylor, Bixenman, Michael L, Tynes, Jason Edward
Year of Publication 09.06.2020
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Year of Publication 09.06.2020
Patent
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
BIXENMAN, Michael L, MCMEEN, Mark Taylor, LOBER, David T, TYNES, Jason Edward
Year of Publication 08.04.2020
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Year of Publication 08.04.2020
Patent
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
BIXENMAN, Michael L, MCMEEN, Mark Taylor, LOBER, David T, TYNES, Jason Edward
Year of Publication 24.04.2019
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Year of Publication 24.04.2019
Patent
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
BIXENMAN, Michael L, MCMEEN, Mark Taylor, LOBER, David T, TYNES, Jason Edward
Year of Publication 28.12.2018
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Year of Publication 28.12.2018
Patent
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
BIXENMAN, MICHAEL L, LOBER, DAVID T, MCMEEN, MARK TAYLOR, TYNES, JASON EDWARD
Year of Publication 07.12.2017
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Year of Publication 07.12.2017
Patent
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
BIXENMAN, Michael L, MCMEEN, Mark Taylor, LOBER, David T, TYNES, Jason Edward
Year of Publication 07.12.2017
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Year of Publication 07.12.2017
Patent