Loss Modeling and System Optimization of Smartwatch Wireless Charging Application
Tian, Qi, Jia, Liang, Liao, Gordon, Scott, Tressa, Lakshmikanthan, Srikanth
Published in 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) (25.02.2024)
Published in 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) (25.02.2024)
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Conference Proceeding
Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method
Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
A Memory Built-In Peer-Repair Architecture for Mesh-Connected Processor Array
Tan, Pai-Yu, Tung, Chih-Hsuan, Wu, Cheng-Wen, Lee, Mincent, Liao, Gordon
Published in 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (18.04.2022)
Published in 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (18.04.2022)
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Conference Proceeding
A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips
Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon
Published in 2022 IEEE International Test Conference in Asia (ITC-Asia) (01.08.2022)
Published in 2022 IEEE International Test Conference in Asia (ITC-Asia) (01.08.2022)
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Conference Proceeding
Weak Die Screening by Feature Prioritized Random Forest for Improving Semiconductor Quality and Reliability
Lin, Shian-Yu, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon
Published in 2022 IEEE International Test Conference in Asia (ITC-Asia) (01.08.2022)
Published in 2022 IEEE International Test Conference in Asia (ITC-Asia) (01.08.2022)
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Conference Proceeding