Direct measurement of stress dependent inversion layer mobility using a novel test structure
Okagaki, T., Tanizawa, M., Uchida, T., Kunikiyo, T., Sonoda, K., Igarashi, M., Ishikawa, K., Takeda, T., Lee, P., Yokomizo, G.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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Conference Proceeding
A full chip integrated power and substrate noise analysis framework for mixed-signal SoC design
Kosaka, D., Bando, Y., Yokomizo, G., Tsuboi, K., Ying Shiun Li, Shen Lin, Nagata, M.
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
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Conference Proceeding
Evaluation of the average performance of topcrosses among food and grain type soybean
Yokomizo, Gilberto K.(Empresa Brasileira de Pesquisa Agropecuária), Vello, Natal A.(Universidade de São Paulo Escola Superior de Agricultura Luíz de Queiróz Departamento de Genética)
Published in Brazilian archives of biology and technology (01.06.2003)
Published in Brazilian archives of biology and technology (01.06.2003)
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Journal Article
Preliminar evaluation of performance in topcrosses between vegetable type and grain type soybean
Yokomizo, Gilberto K.(Embrapa), Vello, Natal A.(USP ESALQ Departamento de Genética), Nekastchalow, Marcos C.(USP ESALQ Departamento de Genética)
Published in Brazilian archives of biology and technology (2000)
Published in Brazilian archives of biology and technology (2000)
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Journal Article