An improved electron and hole mobility model for general purpose device simulation
Darwish, M.N., Lentz, J.L., Pinto, M.R., Zeitzoff, P.M., Krutsick, T.J., Hong Ha Vuong
Published in IEEE transactions on electron devices (01.09.1997)
Published in IEEE transactions on electron devices (01.09.1997)
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Journal Article
ESD design challenges
Sachdev, Manoj, Vuong, Hong-Ha
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
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Conference Proceeding
Use of transient enhanced diffusion to tailor boron out-diffusion
Vuong, H.-H., Xie, Y.-H., Frei, M.R., Hobler, G., Pelaz, L., Rafferty, C.S.
Published in IEEE transactions on electron devices (01.07.2000)
Published in IEEE transactions on electron devices (01.07.2000)
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Journal Article
Process variability characterization and interconnect modeling
Hong-Ha Vuong, Yuhua Cheng
Published in Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 (2005)
Published in Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 (2005)
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Conference Proceeding
Sidegating in a GaAs MBE-grown HFET structure
Vuong, T.H.H., Gibson, W.C., Ahrens, R.E., Parsey, J.M.
Published in IEEE transactions on electron devices (01.01.1990)
Published in IEEE transactions on electron devices (01.01.1990)
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Journal Article
Impact of interface impurities on heterostructure field-effect transistors
Reynolds, C.L., Vuong, H.H.T., Peticolas, L.J.
Published in IEEE transactions on electron devices (01.11.1992)
Published in IEEE transactions on electron devices (01.11.1992)
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Journal Article