A Wideband Low Noise Amplifier With 4 kV HBM ESD Protection in 65 nm RF CMOS
Ming-Hsien Tsai, Hsu, S.S.H., Fu-Lung Hsueh, Chewn-Pu Jou, Sean Chen, Ming-Hsiang Song
Published in IEEE microwave and wireless components letters (01.11.2009)
Published in IEEE microwave and wireless components letters (01.11.2009)
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Journal Article
Layout Guidelines against Charging Damage from the Well-Side Antennas in Separated Power Domains
Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Kuo, Shu-Cheng, Guo, Ethan, Zhang, Ya-Min, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Li, Te-Liang, Huang, Ray, Chen, Kuo-Ji, Song, Ming-Hsiang, Lu, Ryan, Xia, Kejun
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A 60 V Tolerance Transceiver With ESD Protection for FlexRay-Based Communication Systems
Wang, Chua-Chin, Chen, Chih-Lin, Hou, Zong-You, Hu, Yi, Lee, Jam-Wem, Lin, Wan-Yen, Chang, Yi-Feng, Hsu, Chia-Wei, Song, Ming-Hsiang
Published in IEEE transactions on circuits and systems. I, Regular papers (01.03.2015)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.03.2015)
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Journal Article
FinFET SCR structure optimization for high-speed serial links ESD protection
Li-Wei Chu, Yi-Feng Chang, Yu-Ti Su, Kuo-Ji Chen, Ming-Hsiang Song, Jam-Wem Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Improving ESD robustness of stacked diodes with embedded SCR for RF applications in 65-nm CMOS
Chun-Yu Lin, Mei-Lian Fan, Ming-Dou Ker, Li-Wei Chu, Jen-Chou Tseng, Ming-Hsiang Song
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Novel dual direction PNP with self-bias ring structure
Tsung-Che Tsai, Jam-Wem Lee, Ming-Fu Tsai, Yi-Feng Chang, Shui-Ming Cheng, Ming-Hsiang Song
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
ESD protection design for wideband RF applications in 65-nm CMOS process
Li-Wei Chu, Chun-Yu Lin, Ming-Dou Ker, Ming-Hsiang Song, Jen-Chou Tseng, Chewn-Pu Jou, Ming-Hsien Tsai
Published in 2014 IEEE International Symposium on Circuits and Systems (ISCAS) (01.06.2014)
Published in 2014 IEEE International Symposium on Circuits and Systems (ISCAS) (01.06.2014)
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Conference Proceeding
Bias Temperature Stress (BTS) induced ESD device's leakage issue and Its preventing solutions in smart power technology
Chien-Fu Huang, Yi-Feng Chang, Shui-Ming Cheng, Ming-Hsiang Song
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology
Li-Wei Chu, Chun-Yu Lin, Shiang-Yu Tsai, Ming-Dou Ker, Ming-Hsiang Song, Chewn-Pu Jou, Tse-Hua Lu, Jen-Chou Tseng, Ming-Hsien Tsai, Tsun-Lai Hsu, Ping-Fang Hung, Tzu-Heng Chang
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
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Conference Proceeding
A 6.5kV ESD-protected low noise amplifier in 65-nm CMOS
Ming-Hsien Tsai, Fu-Lung Hsueh, Chewn-Pu Jou, Ming-Hsiang Song, Jen-Chou Tseng, Hsu, Shawn S H, Sean Chen
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
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Conference Proceeding
Enabling circuit design using FinFETs through close ecosystem collaboration
Sheu, Bing J., Chih-Sheng Chang, Yen-Huei Chen, Ken Wang, Kuo-Ji Chen, Yung-Chow Peng, Li-Chun Tien, Ming-Hsiang Song, Hou, Cliff, Sun, Jack Yuan-Chen, Chenming Hu
Published in 2013 Symposium on VLSI Technology (01.06.2013)
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Published in 2013 Symposium on VLSI Technology (01.06.2013)
Conference Proceeding
ESD protection structure with inductor-triggered SCR for RF applications in 65-nm CMOS process
Chun-Yu Lin, Li-Wei Chu, Ming-Dou Ker, Ming-Hsiang Song, Chewn-Pu Jou, Tse-Hua Lu, Jen-Chou Tseng, Ming-Hsien Tsai, Tsun-Lai Hsu, Ping-Fang Hung, Tzu-Heng Chang
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
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Conference Proceeding
Gate-driven 3.3V ESD clamp using 1.8V transistors
Guang-Cheng Wang, Chia-Hui Chen, Wen-Hsin Huang, Kuo-Ji Chen, Ming-Hsiang Song, Ta-Pen Guo
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding
An ultra-low power K-band low-noise amplifier co-designed with ESD protection in 40-nm CMOS
Ming-Hsien Tsai, Hsu, S S H, Fu-Lung Hsueh, Chewn-Pu Jou, Tzu-Jin Yeh, Ming-Hsiang Song, Jen-Chou Tseng
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding