Application of Test-View Modeling to Hierarchical ATPG
Shukla, Rahul, Phong Loi, Margulis, Arie, Pham, Ken, Yang, Kathy, Tamarapalli, Nagesh
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
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Conference Proceeding
Journal Article
A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor
Payakapan, Tassanee, Senwen Kan, Pham, Ken, Yang, Kathy, Cote, J.-F, Keim, Martin, Dworak, Jennifer
Published in 2015 IEEE International Test Conference (ITC) (01.10.2015)
Published in 2015 IEEE International Test Conference (ITC) (01.10.2015)
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Conference Proceeding