Design Guidelines of Multibridge Channel-Ferroelectric FET for 3-nm Node and Beyond
Lee, Kynghwan, Hong, Jungpyo, Kuh, Bong Jin, Ha, Daewon, Hyun, Sangjin, Ahn, Sujin, Song, Jaihyuk
Published in IEEE transactions on electron devices (07.10.2024)
Published in IEEE transactions on electron devices (07.10.2024)
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Journal Article
A Comprehensive Study of Transient Characteristics in FeFET Using In-Situ V t Measurement Method
Myeong, Ilho, Kim, Hyoseok, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk
Published in IEEE electron device letters (01.08.2024)
Published in IEEE electron device letters (01.08.2024)
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Journal Article
A Comprehensive Study of Transient Characteristics in FeFET Using In-Situ Vt Measurement Method
Myeong, Ilho, Kim, Hyoseok, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk
Published in IEEE electron device letters (01.08.2024)
Published in IEEE electron device letters (01.08.2024)
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Journal Article
A new approach of NAND flash cell trap analysis using RTN characteristics
Daewoong Kang, Sungbok Lee, Hyun-Mog Park, Dong-jun Lee, Jun Kim, Junho Seo, Chikyoung Lee, Cheol Song, Chang-Sub Lee, Hyungcheol Shin, Jaihyuk Song, Haebum Lee, Jeong-Hyuk Choi, Young-Hyun Jun
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
Strategies for a Wide Memory Window of Ferroelectric FET for Multilevel Ferroelectric VNAND Operation
Myeong, Ilho, Kim, Hyoseok, Kim, Seunghyun, Lim, Suhwan, Kim, Kwangsu, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk
Published in IEEE electron device letters (01.07.2024)
Published in IEEE electron device letters (01.07.2024)
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Journal Article
A Metal Dual Work-Function Gate (MDWG) for the Continuous Scaling of DRAM Cell Transistors
Kim, Junsoo, Lee, Hyun Jung, Jang, Sung Ho, Lee, Jun Bum, Kim, Il Gweon, Oh, Jeonghoon, Park, Jemin, Song, Jaihyuk
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor
Jeong, Moonyoung, Lee, Sangho, Jun, Yootak, Lee, Kiseok, Park, Seokhan, Oh, Jeonghoon, Kim, Ilgweon, Park, Jemin, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory
Lee, Dongjin, Lee, Yunjo, Na, Soyeong, Yun, KangOh, Baek, Sungkweon, Lee, Jaeduk, Jang, Jaehoon, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A 1Tb 3b/Cell 8th-Generation 3D-NAND Flash Memory with 164MB/s Write Throughput and a 2.4Gb/s Interface
Kim, Moosung, Yun, Sung Won, Park, Jungjune, Park, Hyun Kook, Lee, Jungyu, Kim, Yeong Seon, Na, Daehoon, Choi, Sara, Song, Youngsun, Lee, Jonghoon, Yoon, Hyunjun, Lee, Kangbin, Jeong, Byunghoon, Kim, Sanglok, Park, Junhong, Lee, Cheon An, Lee, Jaeyun, Lee, Jisang, Chun, Jin Young, Jang, Joonsuc, Yang, Younghwi, Moon, Seung Hyun, Choi, Myunghoon, Kim, Wontae, Kim, Jungsoo, Yoon, Seokmin, Kwak, Pansuk, Lee, Myunghun, Song, Raehyun, Kim, Sunghoon, Yoon, Chiweon, Kang, Dongku, Lee, Jin-Yub, Song, Jaihyuk
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
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Conference Proceeding
Expanding Design Technology Co-Optimization Potentials with Back-Side Interconnect Innovation
Kim, Byung-Sung, Choi, Subin, Lee, Jung Han, Lee, Kwangmuk, Park, Jisoo, Kwon, Jiwook, Park, Saehan, Chun, Kwanyoung, Simka, Harsono, Kumar, Aravindh, Ul Karim, Muhammed Ahosan, Rim, Ken, Song, Jaihyuk
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Highly manufacturable Self-Aigned Direct Backside Contact (SA-DBC) and Backside Gate Contact (BGC) for 3-dimensional Stacked FET at 48nm gate pitch
Park, Jaehyun, Park, Juhun, Hwang, Kyuman, Yun, Jinchan, Kim, Dahye, Park, Sungil, Park, Jejune, Yang, Jinwook, Jeong, Jae Won, Yun, Chuljin, Bae, Jinho, Park, Sam, Huh, Daihong, Kim, Sanghyeon, Baek, Seungeun, Yang, Suk, Zoh, Inhae, Lee, Junghan, Kim, Tae-sun, Ha, Younsu, Lee, Sun-Jung, Park, Sang Wuk, Kuh, Bong Jin, Ha, Daewon, Hyun, Sangjin, Ahn, Su Jin, Song, Jaihyuk
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Cell to Core-Periphery Overlap (C2O) Based on BCAT for Next Generation DRAM
Lee, Kiseok, Lee, Hongjun, Choi, Hyungeun, Kim, Jeongsu, Kim, Kyunghwan, Jeong, Moonyoung, Bae, Soohyun, Kim, Hyebin, Lee, Jiyun, Kim, Minsoo, Kim, Keunnam, Kim, Huijung, Park, Sungmin, Park, Taejin, Han, Jin-woo, Oh, Jeonghoon, Kim, Yong Kwan, Yim, Sungsoo, Kim, Bongsoo, Park, Jemin, Song, Jaihyuk
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Highly-Reliable Cell Characteristics with 128-Layer Single-Stack 3D-NAND Flash Memory
Park, Sejun, Lee, Jaeduk, Jang, Jaehoon, Lim, Jong Kwang, Kim, Hyunjung, Shim, Jae Joo, Yu, Min-tai, Kang, Jin-Kyu, Ahn, Su Jin, Song, JaiHyuk
Published in 2021 Symposium on VLSI Technology (13.06.2021)
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Published in 2021 Symposium on VLSI Technology (13.06.2021)
Conference Proceeding
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND
Myeong, Ilho, Lim, Suhwan, Kim, Taeyoung, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Munkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Jisung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoon, Ilyounz, Kim, Jaeho, Kim, Kwangsoo, Park, Kwangmin, Kuh, Bong Jin, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Heo, Jinseong
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
6.10 A 1/1.56-inch 50Mpixel CMOS Image Sensor with 0.5μm pitch Quad Photodiode Separated by Front Deep Trench Isolation
Kim, DongHyun, Cho, Kwansik, Ji, Ho-Chul, Kim, Minkyung, Kim, Junghye, Kim, Taehoon, Seo, Seungju, Im, Dongmo, Lee, You-Na, Choi, Jinyong, Yoon, Sunghyun, Noh, Inho, Kim, Jinhyung, Lee, Khang June, Jung, Hyesung, Shin, Jongyoon, Hur, Hyuk, Chang, Kyoung Eun, Cho, Incheol, Woo, Kieyoung, Moon, Byung Seok, Kim, Jameyung, Ahn, Yeonsoo, Sim, Dahee, Park, Sungbong, Lee, Wook, Kim, Kooktae, Chang, Chong Kwang, Yoon, Hansik, Kim, Juha, Kim, Sung-In, Kim, Hyunchul, Moon, Chang-Rok, Song, Jaihyuk
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
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Conference Proceeding
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET
Kim, Taeyoung, Lim, Suhwan, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Ji-sung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Yoon, Ilyoung, Kim, Chaeho, Kim, Kwanzsoo, Park, Kwanzmin, Kuh, Bong Jin, Heo, Jinseong, Kim, Wanki, Ha, Daewon, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Highly Manufacturable 7th Generation 3D NAND Flash Memory with COP structure and Double Stack Process
Kim, Jun Hyoung, Yim, Yongsik, Lim, Joonsung, Kim, Hyun Suk, Suk Cho, Eun, Yeo, Chadong, Lee, Woongseop, You, Byungkwan, Lee, Byoungil, Kang, Minkyu, Jang, Woojae, Kwon, Youngho, Lee, Keehong, Lee, Jaeduk, Kim, Myeong-Cheol, Lee, Jin-Yub, Hur, Sunghoi, Ahn, Su Jin, Hong, Hyeongsun, Shin, Yu Gyun, Kim, Hyoung-Sub, Song, Jaihyuk
Published in 2021 Symposium on VLSI Technology (13.06.2021)
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Published in 2021 Symposium on VLSI Technology (13.06.2021)
Conference Proceeding
30.3 A 512Gb 3b/Cell 7th -Generation 3D-NAND Flash Memory with 184MB/s Write Throughput and 2.0Gb/s Interface
Cho, Jiho, Kang, D. Chris, Park, Jongyeol, Nam, Sang-Wan, Song, Jung-Ho, Jung, Bong-Kil, Lyu, Jaedoeg, Lee, Hogil, Kim, Won-Tae, Jeon, Hongsoo, Kim, Sunghoon, Kim, In-Mo, Son, Jae-Ick, Kang, Kyoungtae, Shim, Sang-Won, Park, JongChul, Lee, Eungsuk, Kang, Kyung-Min, Park, Sang-Won, Lee, Jaeyun, Moon, Seung Hyun, Kwak, Pansuk, Jeong, ByungHoon, Lee, Cheon An, Kim, Kisung, Ko, Junyoung, Kwon, Tae-Hong, Lee, Junha, Lee, Yohan, Kim, Chaehoon, Lee, Myeong-Woo, Yun, Jeong-yun, Lee, HoJun, Choi, Yonghyuk, Hong, Sanggi, Park, JongHoon, Shin, Yoonsung, Kim, Hojoon, Kim, Hansol, Yoon, Chiweon, Byeon, Dae Seok, Lee, Seungjae, Lee, Jin-Yub, Song, Jaihyuk
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding