Understanding Strain-Induced Drive-Current Enhancement in Strained-Silicon n-MOSFET and p-MOSFET
Flachowsky, Stefan, Wei, Andy, Illgen, Ralf, Herrmann, Tom, Höntschel, Jan, Horstmann, Manfred, Klix, Wilfried, Stenzel, Roland
Published in IEEE transactions on electron devices (01.06.2010)
Published in IEEE transactions on electron devices (01.06.2010)
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Journal Article
Channel Engineering for Nanotransistors in a Semiempirical Quantum Transport Model
Wulf, Ulrich, Kučera, Jan, Richter, Hans, Horstmann, Manfred, Wiatr, Maciej, Höntschel, Jan
Published in Mathematics (Basel) (22.11.2017)
Published in Mathematics (Basel) (22.11.2017)
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Journal Article
Improving Accuracy and Precision of Strain Analysis by Energy-Filtered Nanobeam Electron Diffraction
Hähnel, Angelika, Reiche, Manfred, Moutanabbir, Oussama, Blumtritt, Horst, Geisler, Holm, Höntschel, Jan, Engelmann, Hans-Jürgen
Published in Microscopy and microanalysis (01.02.2012)
Published in Microscopy and microanalysis (01.02.2012)
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