Hot electron and hot hole degradation of UHV/CVD SiGe HBT's
Gogineni, U., Cressler, J.D., Niu, G., Harame, D.L.
Published in IEEE transactions on electron devices (01.07.2000)
Published in IEEE transactions on electron devices (01.07.2000)
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Journal Article
Measurement of collector-base junction avalanche multiplication effects in advanced UHV/CVD SiGe HBT's
Niu, G., Cressler, J.D., Zhang, S., Gogineni, U., Ahlgren, D.C.
Published in IEEE transactions on electron devices (01.05.1999)
Published in IEEE transactions on electron devices (01.05.1999)
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Journal Article
A comparison of the effects of gamma irradiation on SiGe HBT and GaAs HBT technologies
Zhang, S., Niu, G., Cressler, J.D., Mathew, S.J., Gogineni, U., Clark, S.D., Zampardi, P., Pierson, R.L.
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
Collector-base junction avalanche multiplication effects in advanced UHV/CVD SiGe HBTs
Niu, G., Cressler, J.D., Gogineni, U., Harame, D.L.
Published in IEEE electron device letters (01.08.1998)
Published in IEEE electron device letters (01.08.1998)
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Journal Article
Comparison of current gain and low-frequency noise degradation by hot electrons and hot holes under reverse EB stress in UHV/CVD SiGe HBTs
Gogineni, U., Guofu Niu, Mathew, S.J., Cressler, J.D., Ahlgren, D.C.
Published in Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.98CH36198) (1998)
Published in Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.98CH36198) (1998)
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Conference Proceeding
Analytical model for RF power performance of deeply scaled CMOS devices
Gogineni, U., del Alamo, J., Valdes-Garcia, A.
Published in 2011 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2011)
Published in 2011 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2011)
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Conference Proceeding
Effect of substrate contact shape and placement on RF characteristics of 45 nm low power CMOS devices
Gogineni, U., Li, H., Sweeney, S., Wang, J., Jagannathan, B., del Alamo, J.
Published in 2009 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2009)
Published in 2009 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2009)
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Conference Proceeding