Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.
Published in IEEE transactions on nuclear science (01.06.1996)
Published in IEEE transactions on nuclear science (01.06.1996)
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