A Reliability Study of a New Nanocrystalline Nickel Alloy Barrier Layer for Electrical Contacts
Do, Trent K, Lund, Alan
Published in 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (01.10.2010)
Published in 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (01.10.2010)
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