Impact of DC and RF non-conducting stress on nMOS reliability
Cattaneo, A., Pinarello, S., Mueller, J.-E, Weigel, R.
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
MOSFET degradation under DC and RF Fowler-Nordheim stress
Cattaneo, A., Pinarello, S., Mueller, J.-E, Weigel, R.
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
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Conference Proceeding
Frequency response of stress-effects on CMOS power amplifiers
Cattaneo, A., Pinarello, S., Mueller, J-E, Weigel, R.
Published in 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) (01.10.2014)
Published in 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) (01.10.2014)
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Conference Proceeding
An unconventional VNA-based time-domain waveform load-pull test bench
Teppati, V, Pinarello, S, Ferrero, A, Mueller, Jan-Erik
Published in 2010 Asia-Pacific Microwave Conference (01.12.2010)
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Published in 2010 Asia-Pacific Microwave Conference (01.12.2010)
Conference Proceeding
Highly linear robust RF switch with low insertion loss and high power handling capability in a 65nm CMOS technology
Rascher, J., Pinarello, S., Mueller, J-E, Fischer, G., Weigel, R.
Published in 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (01.01.2012)
Published in 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (01.01.2012)
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Conference Proceeding
Geometrical demonstration of the VSWR-locus in different reference planes and its applications
Pinarello, S., Mueller, J.-E., Weigel, R.
Published in 2009 Asia Pacific Microwave Conference (01.12.2009)
Published in 2009 Asia Pacific Microwave Conference (01.12.2009)
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Conference Proceeding
Methods for low insertion loss RF Switches with increased power handling capability in 65nm CMOS
Rascher, J., Pinarello, S., Mueller, Jan-Erik, Fischer, G., Weigel, R.
Published in Asia-Pacific Microwave Conference 2011 (01.12.2011)
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Published in Asia-Pacific Microwave Conference 2011 (01.12.2011)
Conference Proceeding
구강 내 스캐너, 구강 내 스캐닝 시스템, 구강 내 스캔을 수행하는 방법 및 컴퓨터 프로그램 제품
PINARELLO GIORDANO, GIANI CLAUDIO, CESARATTO ANNA, NASON FRANCESCA, BAILINI ALESSANDRO
Year of Publication 05.08.2024
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Year of Publication 05.08.2024
Patent
Joint adaptive bias point adjustment and digital pre-distortion for power amplifier
CAMUFFO ANDREA, GOE CHI-TAO, SOGL BERNHARD, PINARELLO SANDRO, MUELLER JAN-ERIK, SHUTE NICK
Year of Publication 29.08.2012
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Year of Publication 29.08.2012
Patent
Apparatus and method for providing amplifier linearity information
CAMUFFO ANDREA, GOE CHI-TAO, SOGL BERNHARD, PINARELLO SANDRO, MUELLER JAN-ERIK, SHUTE NICK
Year of Publication 01.08.2012
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Year of Publication 01.08.2012
Patent