In-Situ Monitoring the Growth of Polypyrrole Films at Liquid/Solid Interface Using a Combination of Polarized Infrared Spectroscopy and Reflectance Anisotropy Spectroscopy
Sun, Guoguang, Zhang, Xin, Kaspari, Christian, Haberland, Kolja, Rappich, Jörg, Hinrichs, Karsten
Published in Journal of the Electrochemical Society (01.01.2012)
Published in Journal of the Electrochemical Society (01.01.2012)
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In-situ photoluminescence measurements during MOVPE of GaN and InGaN in a CCS reactor
Prall, Christoph, Kaspari, Christian, Knauer, Arne, Haberland, Kolja, Weyers, Markus, Rueter, Dirk
Published in Technisches Messen (27.11.2017)
Published in Technisches Messen (27.11.2017)
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METHOD FOR CALIBRATING A PYROMETER, METHOD FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER AND SYSTEM FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER
SCHENK TOBIAS, ZETTLER JOERG THOMAS, HENNINGER BERND, UREDAT STEFFEN, BINETTI MARCELLO, ZILIAN JENS, HABERLAND KOLJA
Year of Publication 22.11.2010
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Year of Publication 22.11.2010
Patent
Method for calibrating a two-wavelength pyrometer, method for determining the temperature of a semiconducting wafer and a system for determining the temperature of a semiconducting wafer
Kaspari, Christian, Zettler, Joerg-Thomas, Cornwell, David William, Nash, James Henry, Haberland, Kolja Lutz
Year of Publication 16.09.2020
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Year of Publication 16.09.2020
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Method for calibrating a two-wavelength pyrometer, method for determining the temperature of a semiconducting wafer and a system for determining the temperature of a semiconducting wafer
HABERLAND, KOLJA LUTZ, CORNWELL, DAVID WILLIAM, NASH, JAMES HENRY, KASPARI, CHRISTIAN, ZETTLER, JOERG-THOMAS
Year of Publication 24.06.2015
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Year of Publication 24.06.2015
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Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
SCHENK TOBIAS, HENNINGER BERND, UREDAT STEFFEN, BINETTI MARCELLO, ZILIAN JENS, ZETTLER JOERG-THOMAS, HABERLAND KOLJA
Year of Publication 05.03.2013
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Year of Publication 05.03.2013
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Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
HABERLAND, KOLJA, UREDAT, STEFFEN, BINETTI, MARCELLO, ZILIAN, JENS, SCHENK, TOBIAS, HENNINGER, BERND, ZETTLER, JOERG-THOMAS
Year of Publication 18.07.2012
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Year of Publication 18.07.2012
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VERFAHREN ZUR KALIBRIERUNG EINES PYROMETERS, VERFAHREN ZUR BESTIMMUNG DER TEMPERATUR EINES HALBLEITERWAFERS UND SYSTEM ZUR BESTIMMUNG DER TEMPERATUR EINES HALBLEITERWAFERS
HABERLAND, KOLJA, UREDAT, STEFFEN, BINETTI, MARCELLO, ZILIAN, JENS, SCHENK, TOBIAS, HENNINGER, BERND, ZETTLER, JOERG-THOMAS
Year of Publication 15.02.2012
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Year of Publication 15.02.2012
Patent
Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
HABERLAND, KOLJA, UREDAT, STEFFEN, BINETTI, MARCELLO, ZILIAN, JENS, SCHENK, TOBIAS, HENNINGER, BERND, ZETTLER, JOERG-THOMAS
Year of Publication 25.01.2012
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Year of Publication 25.01.2012
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Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
HABERLAND, KOLJA, UREDAT, STEFFEN, BINETTI, MARCELLO, ZILIAN, JENS, SCHENK, TOBIAS, HENNINGER, BERND, ZETTLER, JOERG-THOMAS
Year of Publication 14.09.2011
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Year of Publication 14.09.2011
Patent
METHOD FOR CALIBRATING A PYROMETER, METHOD FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER AND SYSTEM FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER
SCHENK TOBIAS, HENNINGER BERND, UREDAT STEFFEN, BINETTI MARCELLO, ZILIAN JENS, ZETTLER JOERG-THOMAS, HABERLAND KOLJA
Year of Publication 18.11.2010
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Year of Publication 18.11.2010
Patent
Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
HABERLAND, KOLJA, UREDAT, STEFFEN, BINETTI, MARCELLO, ZILIAN, JENS, SCHENK, TOBIAS, HENNINGER, BERND, ZETTLER, JOERG-THOMAS
Year of Publication 17.11.2010
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Year of Publication 17.11.2010
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