Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83
Kim, Jung Hyeun, Mulholland, George W, Kukuck, Scott R, Pui, David Y H
Published in Journal of research of the National Institute of Standards and Technology (01.01.2005)
Published in Journal of research of the National Institute of Standards and Technology (01.01.2005)
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Journal Article
Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis
Mulholland, George W, Donnelly, Michelle K, Hagwood, Charles R, Kukuck, Scott R, Hackley, Vincent A, Pui, David Y H
Published in Journal of research of the National Institute of Standards and Technology (01.07.2006)
Published in Journal of research of the National Institute of Standards and Technology (01.07.2006)
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Journal Article