Search Results - "BOLAM, RONALD J" :: K.UTB vyhledávací portál

Monitoring aging of silicon in an integrated circuit device

by RAJAMANI KARTHICK, ALLEN-WARE MALCOLM S, DRAKE ALAN J, MITTL STEVEN W, LINDER BARRY P, BOLAM RONALD J, LEFURGY CHARLES R
Year of Publication 12.04.2016

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Design structure for semiconductor on-chip repair scheme for negative bias temperature instability

by SULLIVAN TIMOTHY D, LEE TOM C, BOLAM RONALD J
Year of Publication 15.02.2011

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Semiconductor on-chip repair scheme for negative bias temperature instability

by SULLIVAN TIMOTHY D, LEE TOM C, BOLAM RONALD J
Year of Publication 23.11.2010

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Monitoring Aging of Silicon in an Integrated Circuit Device

by RAJAMANI KARTHICK, ALLEN-WARE MALCOLM S, DRAKE ALAN J, MITTL STEVEN W, LINDER BARRY P, BOLAM RONALD J, LEFURGY CHARLES R
Year of Publication 28.08.2014

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STRUCTURE FOR SEMICONDUCTOR ON-CHIP REPAIR SCHEME FOR NEGATIVE BIAS TEMPERATURE INSTABILITY

by SULLIVAN TIMOTHY D, LEE TOM C, BOLAM RONALD J
Year of Publication 16.07.2009

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Semiconductor On-Chip Repair Scheme for Negative Bias Temperature Instability

by SULLIVAN TIMOTHY D, LEE TOM C, BOLAM RONALD J
Year of Publication 16.07.2009

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Managing aging of silicon in an integrated circuit device

by RAJAMANI KARTHICK, ALLEN-WARE MALCOLM S, DRAKE ALAN J, MITTL STEVEN W, LINDER BARRY P, BOLAM RONALD J, LEFURGY CHARLES R
Year of Publication 29.04.2014

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MONITORING DEGRADATION OF CIRCIUT SPEED

by STAWIASZ KEVIN G, JENKINS KEITH A, BOLAM RONALD J
Year of Publication 05.03.2009

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Method and structure for creation of a metal insulator metal capacitor

by DOWNES KEITH E, COOLBAUGH DOUGLAS D, FEILCHENFELD NATALIE B, BOLAM RONALD J, HE ZHONG-XIANG, ESHUN EBENEZER E
Year of Publication 24.07.2012

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Silicon-on-insulator chip having an isolation barrier for reliability

by KULKAMI SUBHASH B, SCHEPIS DOMINIC J, BOLAM RONALD J
Year of Publication 27.05.2008

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Method for correcting for asymmetry of threshold voltage shifts

by SHEETS, II JOHN E, KUEPER TERRANCE W, PAULSEN DAVID P, BOLAM RONALD J
Year of Publication 02.06.2009

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METHOD AND STRUCTURE FOR CREATION OF A METAL INSULATOR METAL CAPACITOR

by DOWNES KEITH E, COOLBAUGH DOUGLAS D, FEILCHENFELD NATALIE B, BOLAM RONALD J, HE ZHONG-XIANG, ESHUN EBENEZER E
Year of Publication 17.06.2010

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Method and structure for creation of a metal insulator metal capacitor

by DOWNES KEITH E, COOLBAUGH DOUGLAS D, FEILCHENFELD NATALIE B, BOLAM RONALD J, HE ZHONG-XIANG, ESHUN EBENEZER E
Year of Publication 01.06.2010

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Silicon-on-insulator chip having an isolation barrier for reliability

by KULKARNI SUBHASH B, SCHEPIS DOMINIC J, BOLAM RONALD J
Year of Publication 13.05.2003

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Silicon-on-insulator chip having an isolation barrier for reliability

by KULKARNI SUBHASH B, SCHEPIS DOMINIC J, BOLAM RONALD J
Year of Publication 10.12.2002

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Silicon-on-insulator chip having an isolation barrier for reliability

by KULKARNI SUBHASH B, SCHEPIS DOMINIC J, BOLAM RONALD J
Year of Publication 18.04.2002

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Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability

by VAN HORN JODY J, NOWAK EDWARD J, BERNSTEIN KERRY, STRONG ALVIN W, WU ERNEST Y, BOLAM RONALD J
Year of Publication 20.11.2007

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METHOD AND STRUCTURE FOR CREATION OF A METAL INSULATOR METAL CAPACITOR

by DOWNES KEITH E, COOLBAUGH DOUGLAS D, FEILCHENFELD NATALIE B, BOLAM RONALD J, HE ZHONG-XIANG, ESHUN EBENEZER E
Year of Publication 15.11.2007

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Process of manufacturing silicon-on-insulator chip having an isolation barrier for reliability

by KULKARNI SUBHASH B, SCHEPIS DOMINIC J, BOLAM RONALD J
Year of Publication 28.08.2001

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