High-voltage, double-gate devices on silicon-on-insulator
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Journal Article
Conference Proceeding
TESTING FOR CORRECT UNDERCUTTING OF AN ELECTRODE DURING AN ETCHING STEP
GOPALAN ZINGG SUDHA, MARTENS THEODORUS H.G, ZINGG RENE P, DOORNVELD HERMAN E
Year of Publication 29.07.2010
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Year of Publication 29.07.2010
Patent