Micro- and Nanostructure Analysis of Vapor-Phase-Grown AlN on Face-to-Face Annealed Sputtered AlN/Nanopatterned Sapphire Substrate Templates
Nakanishi, Yudai, Hayashi, Yusuke, Hamachi, Takeaki, Tohei, Tetsuya, Nakajima, Yoshikata, Xiao, Shiyu, Shojiki, Kanako, Miyake, Hideto, Sakai, Akira
Published in Journal of electronic materials (01.08.2023)
Published in Journal of electronic materials (01.08.2023)
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Correlation between current leakage and structural properties of threading dislocations in GaN bulk single crystals grown using a Na-flux method
Hamachi, Takeaki, Tohei, Tetsuya, Imanishi, Masayuki, Mori, Yusuke, Sakai, Akira
Published in Japanese Journal of Applied Physics (01.06.2019)
Published in Japanese Journal of Applied Physics (01.06.2019)
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Multivariate Statistical Characterization of Charged and Uncharged Domain Walls in Multiferroic Hexagonal YMnO3 Single Crystal Visualized by a Spherical Aberration-Corrected STEM
Matsumoto, Takao, Ishikawa, Ryo, Tohei, Tetsuya, Kimura, Hideo, Yao, Qiwen, Zhao, Hongyang, Wang, Xiaolin, Chen, Dapeng, Cheng, Zhenxiang, Shibata, Naoya, Ikuhara, Yuichi
Published in Nano letters (09.10.2013)
Published in Nano letters (09.10.2013)
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Depth-resolved analysis of lattice distortions in high-Ge-content SiGe/compositionally graded SiGe films using nanobeam x-ray diffraction
Shida, Kazuki, Takeuchi, Shotaro, Tohei, Tetsuya, Imai, Yasuhiko, Kimura, Shigeru, Schulze, Andreas, Caymax, Matty, Sakai, Akira
Published in Semiconductor science and technology (25.10.2018)
Published in Semiconductor science and technology (25.10.2018)
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Quantitative analysis of lattice plane microstructure in the growth direction of a modified Na-flux GaN crystal using nanobeam X-ray diffraction
Shida, Kazuki, Yamamoto, Nozomi, Tohei, Tetsuya, Imanishi, Masayuki, Mori, Yusuke, Sumitani, Kazushi, Imai, Yasuhiko, Kimura, Shigeru, Sakai, Akira
Published in Japanese Journal of Applied Physics (01.06.2019)
Published in Japanese Journal of Applied Physics (01.06.2019)
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A new homologous series of iron pnictide oxide superconductors (Fe2As2)(Can + 2(Al, Ti)nOy) (n = 2, 3, 4)
Ogino, Hiraku, Machida, Kenji, Yamamoto, Akiyasu, Kishio, Kohji, Shimoyama, Jun-ichi, Tohei, Tetsuya, Ikuhara, Yuichi
Published in Superconductor science & technology (01.11.2010)
Published in Superconductor science & technology (01.11.2010)
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A new iron pnictide oxide (Fe2As2) (Ca5 (Mg, Ti)4Oy) and a new phase in the Fe―As―Ca―Mg―Ti―O system
OGINO, Hiraku, SHIMIZU, Yasuaki, KAWAGUCHI, Naoto, KISHIO, Kohji, SHIMOYAMA, Jun-Ichi, TOHEI, Tetsuya, IKUHARA, Yuichi
Published in Superconductor science & technology (01.08.2011)
Published in Superconductor science & technology (01.08.2011)
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Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces
Montesa, Christine Marie, Shibata, Naoya, Tohei, Tetsuya, Akiyama, Kazuhiro, Kuromitsu, Yoshirou, Ikuhara, Yuichi
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.10.2010)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.10.2010)
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Conduction mechanism of Schottky contacts fabricated on etch pits originating from single threading dislocation in a highly Si-doped HVPE GaN substrate
Sato, Toshikazu, Hamachi, Takeaki, Tohei, Tetsuya, Hayashi, Yusuke, Imanishi, Masayuki, Usami, Shigeyoshi, Mori, Yusuke, Sakai, Akira
Published in Materials science in semiconductor processing (15.11.2023)
Published in Materials science in semiconductor processing (15.11.2023)
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Local strain distribution analysis in strained SiGe spintronics devices
Onabe, Tomoki, Wu, Zhendong, Tohei, Tetsuya, Hayashi, Yusuke, Sumitani, Kazushi, Imai, Yasuhiko, Kimura, Shigeru, Naito, Takahiro, Hamaya, Kohei, Sakai, Akira
Published in Japanese Journal of Applied Physics (29.02.2024)
Published in Japanese Journal of Applied Physics (29.02.2024)
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Analysis of inverse-piezoelectric-effect-induced lattice deformation in AlGaN/GaN high-electron-mobility transistors by time-resolved synchrotron radiation nanobeam X-ray diffraction
Shiomi, Haruna, Ueda, Akira, Tohei, Tetsuya, Imai, Yasuhiko, Hamachi, Takeaki, Sumitani, Kazushi, Kimura, Shigeru, Ando, Yuji, Hashizume, Tamotsu, Sakai, Akira
Published in Applied physics express (01.09.2021)
Published in Applied physics express (01.09.2021)
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