High-Density Large-Area-Array Interconnects Formed by Low-Temperature Cu/Sn-Cu Bonding for Three-Dimensional Integrated Circuits
Lueck, M. R., Reed, J. D., Gregory, C. W., Huffman, A., Lannon, J. M., Temple, D. S.
Published in IEEE transactions on electron devices (01.07.2012)
Published in IEEE transactions on electron devices (01.07.2012)
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