Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor
Jeong, Moonyoung, Lee, Sangho, Jun, Yootak, Lee, Kiseok, Park, Seokhan, Oh, Jeonghoon, Kim, Ilgweon, Park, Jemin, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory
Lee, Dongjin, Lee, Yunjo, Na, Soyeong, Yun, KangOh, Baek, Sungkweon, Lee, Jaeduk, Jang, Jaehoon, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND
Myeong, Ilho, Lim, Suhwan, Kim, Taeyoung, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Munkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Jisung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoon, Ilyounz, Kim, Jaeho, Kim, Kwangsoo, Park, Kwangmin, Kuh, Bong Jin, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Heo, Jinseong
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET
Kim, Taeyoung, Lim, Suhwan, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Ji-sung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Yoon, Ilyoung, Kim, Chaeho, Kim, Kwanzsoo, Park, Kwanzmin, Kuh, Bong Jin, Heo, Jinseong, Kim, Wanki, Ha, Daewon, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A New Self-Boosting Phenomenon by Soure/Drain Depletion Cut-off in NAND Flash Memory
Dongyean Oh, Changsub Lee, Seungchul Lee, Tae-Kyung Kim, Jaihyuk Song, Jeonghyuk Choi
Published in 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop (01.08.2007)
Published in 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop (01.08.2007)
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Conference Proceeding