A flexible soft error mitigation framework leveraging dynamic partial reconfiguration technology
Bai, Jiyuan, Wang, Xiang, Zhao, Zifeng, Zhang, Zikang, Cai, Chang, Chen, Gengsheng
Published in Microelectronics and reliability (01.02.2024)
Published in Microelectronics and reliability (01.02.2024)
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Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits
Wang, Shu, Cai, Chang, Ning, Bingxu, He, Ze, Huang, Zhiqin, Xu, Lingyan, Shen, Mingjie, Xu, Liewei, Chen, Gengsheng
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.10.2021)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.10.2021)
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A study of the probability of vacancy loop formation in Ni-Cu and Ag-Pd alloys
Smalinskas, K., Gengsheng, Chen, Haworth, J., Tappin, D.K., Robertson, I.M., Kirk, M.A.
Published in Journal of nuclear materials (01.10.1993)
Published in Journal of nuclear materials (01.10.1993)
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