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Year of Publication 28.08.2008
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Partial good integrated circuit and method of testing same
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Year of Publication 13.01.2009
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Year of Publication 07.10.2008
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PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME
FELSKE MICHAEL Z, GILLIS PAMELA S, FARNSWORTH LEONARD O.III, WILDER TAD J, OUELLETTE MICHAEL R, ST. PIERRE THOMAS, LYNCH BENJAMIN P, BARNHART CARL F
Year of Publication 10.01.2008
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Year of Publication 10.01.2008
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