A novel technique for the direct determination of carrier diffusion lengths in GaAs/AlGaAs heterostructures using cathodoluminescence
Sercel, P.C., Zarem, H.A., Lebens, J.A., Eng, L.E., Yariv, A., Vahala, K.J.
Published in International Technical Digest on Electron Devices Meeting (1989)
Published in International Technical Digest on Electron Devices Meeting (1989)
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