High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns
Liang, Zhe-Jia, Wu, Yu-Tsung, Yang, Yun-Feng, Li, James Chien-Mo, Chang, Norman, Kumar, Akhilesh, Li, Ying-Shiun
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Get full text
Conference Proceeding
Interaction of RF DPI with ESD Protection Devices in EMS Testing of IC Chips
Tsukioka, Akihiro, Nagata, Makoto, Fujimoto, Daisuke, Miura, Noriyuki, Akimoto, Rieko, Egami, Takao, Niinomi, Kenji, Yuhara, Takesh, Hayashi, Sachio, Srinivasan, Karthik, Li, Ying-Shiun, Chang, Norman
Published in 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) (01.08.2018)
Published in 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) (01.08.2018)
Get full text
Conference Proceeding
Applying Machine Learning to Design for Reliability Coverage
Chang, Norman, Chuang, Wentze, Tsavatanalli, Ganesh Kumar, Geada, Joao, Zhuang, Hao, Ramachandran, Sankar, Raian, Rahul, Li, Ying-Shiun, Jia, Yaowei, Kaipanatu, Mathew, Mantena, Suresh Kumar, Shih, Ming-Chih, Yang, Anita, Jang, Roger
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Get full text
Conference Proceeding
ESD dynamic methodology for diagnosis and predictive simulation of HBM/CDM events
Ting-Sheng Ku, Jau-Wen Chen, Kokai, G., Chang, N., Shen Lin, Yu Liu, Ying-Shiun Li, Bo Hu
Published in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012 (01.09.2012)
Get full text
Published in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012 (01.09.2012)
Conference Proceeding
Vector-based Dynamic IR-drop Prediction Using Machine Learning
Chen, Jia-Xian, Liu, Shi-Tang, Wu, Yu-Tsung, Wu, Mu-Ting, Li, Chieo-Mo, Chang, Norman, Li, Ying-Shiun, Chuang, Wen-Tze
Published in 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) (17.01.2022)
Published in 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) (17.01.2022)
Get full text
Conference Proceeding
A full chip integrated power and substrate noise analysis framework for mixed-signal SoC design
Kosaka, D., Bando, Y., Yokomizo, G., Tsuboi, K., Ying Shiun Li, Shen Lin, Nagata, M.
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
Get full text
Conference Proceeding
Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor
Liu, Shi-Tang, Chen, Jia-Xian, Wu, Yu-Tsung, Hsieh, Chao-Ho, Li, Chien-Mo, Chang, Norman, Li, Ying-Shiun, Chuang, Wen-Tze
Published in 2022 23rd International Symposium on Quality Electronic Design (ISQED) (06.04.2022)
Published in 2022 23rd International Symposium on Quality Electronic Design (ISQED) (06.04.2022)
Get full text
Conference Proceeding
Machine learning based generic violation waiver system with application on electromigration sign-off
Chang, Norman, Baranwal, Ajay, Zhuang, Hao, Shih, Ming-Chih, Rajan, Rahul, Jia, Yaowei, Liao, Hui-Lun, Li, Ying-Shiun, Ku, Ting, Lin, Rex
Published in 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) (01.01.2018)
Published in 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) (01.01.2018)
Get full text
Conference Proceeding
A Fast Side-Channel Leakage Simulation Technique Based on IC Chip Power Modeling
Tsukioka, Akihiro, Srinivasan, Karthik, Wan, Shan, Lin, Lang, Li, Ying-Shiun, Chang, Norman, Nagata, Makoto
Published in IEEE journal on electromagnetic compatibility practice and applications (01.12.2019)
Published in IEEE journal on electromagnetic compatibility practice and applications (01.12.2019)
Get full text
Journal Article
Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Using Machine Learning
Wu, Yu-Tsung, Liang, Zhe-Jia, Hsieh, Chao-Ho, Yang, Yun-Feng, Lee, Yung-Jen, Li, James Chien-Mo, Chang, Norman, Li, Ying-Shiun, Lin, Lang
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
Get full text
Conference Proceeding
Efficient multi-domain ESD analysis and verification for large SoC designs
Chang, N., Youlin Liao, Ying-Shiun Li, Johari, P., Sarkar, A.
Published in EOS/ESD Symposium Proceedings (01.09.2011)
Get full text
Published in EOS/ESD Symposium Proceedings (01.09.2011)
Conference Proceeding