Normally-OFF Diamond Reverse Blocking MESFET
Canas, J., Pakpour-Tabrizi, A. C., Trajkovic, T., Udrea, F., Eon, D., Gheeraert, E., Jackman, R. B.
Published in IEEE transactions on electron devices (01.12.2021)
Published in IEEE transactions on electron devices (01.12.2021)
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Gate Oxide Electrical Stability of p-type Diamond MOS Capacitors
Loto, O., Florentin, M., Masante, C., Donato, N., Hicks, M.-L., Pakpour-Tabrizi, A. C., Jackman, R. B., Zuerbig, V., Godignon, P., Eon, D., Pernot, J., Udrea, F., Gheeraert, E.
Published in IEEE transactions on electron devices (01.08.2018)
Published in IEEE transactions on electron devices (01.08.2018)
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Journal Article