Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Using Machine Learning
Wu, Yu-Tsung, Liang, Zhe-Jia, Hsieh, Chao-Ho, Yang, Yun-Feng, Lee, Yung-Jen, Li, James Chien-Mo, Chang, Norman, Li, Ying-Shiun, Lin, Lang
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
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