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Published in 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2019)

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Published in 2020 IEEE 29th Asian Test Symposium (ATS) (23.11.2020)

by Yang, Kai-Jiun, Sun, Chi-Tien
Published in Advances in Intelligent Information Hiding and Multimedia Signal Processing

by Lu, Shyue-Kung, Tsai, Zeng-Long, Hsu, Chun-Lung, Sun, Chi-Tien
Published in 2020 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2020)