Compact Test Pattern Selection for Small Delay Defect
Chia-Yuan Chang, Kuan-Yu Liao, Sheng-Chang Hsu, Li, J. C., Jiann-Chyi Rau
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2013)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2013)
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Journal Article
GPU-based n-detect transition fault ATPG
Liao, Kuan-Yu, Hsu, Sheng-Chang, Li, James Chien-Mo
Published in 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC) (29.05.2013)
Published in 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC) (29.05.2013)
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Conference Proceeding