Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor
KWON, Hyuk-Min, HAN, In-Shik, KWON, Sung-Kyu, JANG, Jae-Hyung, KWAK, Ho-Young, CHOI, Woon-Il, HA, Man-Lyun, LEE, Ju-Il, HWANG, Hyun-Sang, LEE, Hi-Deok
Published in IEEE electron device letters (01.02.2013)
Published in IEEE electron device letters (01.02.2013)
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Journal Article
Decrease of Dark Current by Reducing Transfer Transistor Induced Partition Noise With Localized Channel Implantation
PARK, Seong-Hyung, BOK, Jung-Deuk, KWON, Hyuk-Min, CHOI, Woon-Il, HA, Man-Lyun, LEE, Ju-Il, LEE, Hi-Deok
Published in IEEE electron device letters (01.11.2010)
Published in IEEE electron device letters (01.11.2010)
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Journal Article
High-quality solenoid inductor using dielectric film for multichip modules
YOOK, Jong-Min, KO, Ju-Hyun, HA, Man-Lyun, KWON, Young-Se
Published in IEEE transactions on microwave theory and techniques (01.06.2005)
Published in IEEE transactions on microwave theory and techniques (01.06.2005)
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Conference Proceeding
Q-band micro-patch antennas implemented on a high resistivity silicon substrate using the surface micromachining technology
HA, Man-Lyun, CHO, Yong-Heui, PYO, Cheol-Sig, KWON, Young-Se
Published in 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) (2004)
Published in 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) (2004)
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Conference Proceeding
Characterization of Al2O3–HfO2–Al2O3 sandwiched MIM capacitor under DC and AC stresses
Kwak, Ho-Young, Kwon, Hyuk-Min, Jung, Yi-Jung, Kwon, Sung-Kyu, Jang, Jae-Hyung, Choi, Woon-Il, Ha, Man-Lyun, Lee, Ju-Il, Lee, Song-Jae, Lee, Hi-Deok
Published in Solid-state electronics (01.01.2013)
Published in Solid-state electronics (01.01.2013)
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A Study of Dielectric Relaxation and Capacitance Matching of Al2O3/HfO2/Al2O3 MIM Capacitors
HAN, In-Shik, KWON, Hyuk-Min, KWON, Sung-Kyu, CHOI, Woon-Il, SU LIM, KIM, Jin-Soo, KIM, Moon-Ho, HA, Man-Lyun, LEE, Ju-Il, LEE, Hi-Deok
Published in IEEE electron device letters (01.10.2013)
Published in IEEE electron device letters (01.10.2013)
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