X-ray microdiffraction: local stress distributions in polycrystalline and epitaxial thin films
Phillips, M.A, Spolenak, R, Tamura, N, Brown, W.L, MacDowell, A.A, Celestre, R.S, Padmore, H.A, Batterman, B.W, Arzt, E, Patel, J.R
Published in Microelectronic engineering (01.07.2004)
Published in Microelectronic engineering (01.07.2004)
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Journal Article
Conference Proceeding
Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction
Choi, W.J., Lee, T.Y., Tu, K.N., Tamura, N., Celestre, R.S., MacDowell, A.A., Bong, Y.Y., Nguyen, Luu
Published in Acta materialia (08.12.2003)
Published in Acta materialia (08.12.2003)
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Journal Article
Structure and kinetics of Sn whisker growth on Pb-free solder finish
Choi, W.J., Lee, T.Y., Tu, K.N., Tamura, N., Celestre, R.S., Macdowell, A.A., Bong, Y.Y., Nguyen, L., Sheng, G.T.T.
Published in 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345) (2002)
Published in 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345) (2002)
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Conference Proceeding