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Rogez, Guillaume, Viart, Nathalie, Drillon, Marc
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Published in Angewandte Chemie (International ed.) (08.03.2010)
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Domain Wall Architecture in Tetragonal Ferroelectric Thin Films
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Published in Advanced materials (Weinheim) (01.02.2017)
Published in Advanced materials (Weinheim) (01.02.2017)
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Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2−xFexO3
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Published in Journal of applied crystallography (01.08.2016)
Published in Journal of applied crystallography (01.08.2016)
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inserexs: reflection choice software for resonant elastic X‐ray scattering
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Published in Journal of applied crystallography (01.06.2023)
Published in Journal of applied crystallography (01.06.2023)
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Charge Distribution across Capped and Uncapped Infinite‐Layer Neodymium Nickelate Thin Films
Raji, Aravind, Krieger, Guillaume, Viart, Nathalie, Preziosi, Daniele, Rueff, Jean‐Pascal, Gloter, Alexandre
Published in Small (Weinheim an der Bergstrasse, Germany) (01.12.2023)
Published in Small (Weinheim an der Bergstrasse, Germany) (01.12.2023)
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Oxygen crystallographic positions in thin films by non‐destructive resonant elastic X‐ray scattering
Peña Corredor, Antonio, Wendling, Laurianne, Preziosi, Daniele, Schlur, Laurent, Leuvrey, Cédric, Thiaudière, Dominique, Elklaim, Erik, Blanc, Nils, Grenier, Stephane, Roulland, François, Viart, Nathalie, Lefevre, Christophe
Published in Journal of applied crystallography (01.06.2022)
Published in Journal of applied crystallography (01.06.2022)
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Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information
Lefevre, Christophe, Thomasson, Alexandre, Roulland, Francois, Favre-Nicolin, Vincent, Joly, Yves, Wakabayashi, Yusuke, Versini, Gilles, Barre, Sophie, Leuvrey, Cedric, Demchenko, Anna, Boudet, Nathalie, Viart, Nathalie
Published in Journal of applied crystallography (20.06.2016)
Published in Journal of applied crystallography (20.06.2016)
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Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga 2− x Fe x O 3
Lefevre, Christophe, Thomasson, Alexandre, Roulland, Francois, Favre-Nicolin, Vincent, Joly, Yves, Wakabayashi, Yusuke, Versini, Gilles, Barre, Sophie, Leuvrey, Cedric, Demchenko, Anna, Boudet, Nathalie, Viart, Nathalie
Published in Journal of applied crystallography (01.08.2016)
Published in Journal of applied crystallography (01.08.2016)
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ChemInform Abstract: Stabilization of Scandium Rich Spinel Ferrite CoFe 2‐x Sc x O 4 (x ≤ 1) in Thin Films
Lefevre, Christophe, Roulland, Francois, Thomasson, Alexandre, Autissier, Emmanuel, Leuvrey, Cedric, Barre, Sophie, Versini, Gilles, Viart, Nathalie, Pourroy, Genevieve
Published in ChemInform (01.01.2016)
Published in ChemInform (01.01.2016)
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ChemInform Abstract: Stabilization of Scandium Rich Spinel Ferrite CoFe2-xScxO4 (x ≤ 1) in Thin Films
Lefevre, Christophe, Roulland, Francois, Thomasson, Alexandre, Autissier, Emmanuel, Leuvrey, Cedric, Barre, Sophie, Versini, Gilles, Viart, Nathalie, Pourroy, Genevieve
Published in ChemInform (17.12.2015)
Published in ChemInform (17.12.2015)
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