Weaning outcome prediction from heterogeneous time series using Normalized Compression Distance and Multidimensional Scaling
Lillo-Castellano, J.M., Mora-Jiménez, I., Santiago-Mozos, R., Rojo-Álvarez, J.L., Ramiro-Bargueño, J., Algora-Weber, A.
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Published in Expert systems with applications (01.04.2013)
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A method for monitoring the thickness of semiconductor and dielectric thin films: application to the determination of large-area thickness profiles
Laaziz, Y., Bennouna, A., Elazhari, M.Y., Ramiro-Bargueño, J., Outzourhit, A., Chahboun, N., Ameziane, E.L.
Published in Thin solid films (15.07.1997)
Published in Thin solid films (15.07.1997)
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