Annealing effects of polycrystalline silicon gate on electrical properties of thin gate oxide
Cho, Won-Ju, Kim, Eung-Soo, Kang, Jun-Jin, Rha, Kwan-Goo, Kim, Hong-Seok
Published in Solid-state electronics (01.04.1998)
Published in Solid-state electronics (01.04.1998)
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