Generation method of diagnostic algorithms with AE technique for mass produced goods
Yoneyama, Tokao, Sato, Ichiya, Michimoto, Syozo, Kiguchi, Keichi, Sugiyama, Youichi, Taguchi, Yuji, Yanagibashi, Minoru
Published in NDT & E international : independent nondestructive testing and evaluation (01.04.1994)
Published in NDT & E international : independent nondestructive testing and evaluation (01.04.1994)
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