Characterization of the structural defects in CVD-grown monolayered MoS2 using near-field photoluminescence imaging
Lee, Yongjun, Park, Seki, Kim, Hyun, Han, Gang Hee, Lee, Young Hee, Kim, Jeongyong
Published in Nanoscale (28.07.2015)
Published in Nanoscale (28.07.2015)
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Journal Article
Characterization of the structural defects in CVD-grown monolayered MoS sub(2) using near-field photoluminescence imaging
Lee, Yongjun, Park, Seki, Kim, Hyun, Han, Gang Hee, Lee, Young Hee, Kim, Jeongyong
Published in Nanoscale (01.07.2015)
Published in Nanoscale (01.07.2015)
Get full text
Journal Article