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IOP_英国物理学会现刊（含NSTL购买的14种刊）
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Corrosion-induced degradation of microelectronic devices
by
Osenbach
,
John W
Published in
Semiconductor science and technology
(01.02.1996)
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Journal Article
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applied sciences
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engineering
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physics
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anodic oxidation
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applied sciences
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corrosion
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degradation
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electronics
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electronics industry
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IOP_英国物理学会现刊（含NSTL购买的14种刊）
