A partially insulated field-effect transistor (PiFET) as a candidate for scaled transistors
Yeo, K.H., Oh, C.W., Kim, S.M., Kim, M.S., Lee, C.S., Lee, S.Y., Han, S.Y., Yoon, E.J., Cho, H.J., Lee, D.Y., Yoon, B.M., Rhee, H.S., Lee, B.C., Choe, J.D., Chung, I., Park, D., Kim, K.
Published in IEEE electron device letters (01.06.2004)
Published in IEEE electron device letters (01.06.2004)
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Journal Article
A 22-nm damascene-gate MOSFET fabrication with 0.9-nm EOT and local channel implantation
Jeong-Dong Choe, Chang-Sub Lee, Sung-Ho Kim, Sung-Min Kim, Shin-Ae Lee, Ju-Won Lee, Shin, Y.-G., Donggun Park, Kinam Kim
Published in IEEE electron device letters (01.03.2003)
Published in IEEE electron device letters (01.03.2003)
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Journal Article
The Effect of Field Oxide Recess on Cell V Distribution of nand Flash Cell Arrays
Park, Mincheol, Lee, Chang-Sub, Hur, Sung-Hoi, Kim, Keonsoo, Lee, Won-Seong
Published in IEEE electron device letters (01.09.2008)
Published in IEEE electron device letters (01.09.2008)
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Journal Article
A new GIDL phenomenon by field effect of neighboring cell transistors and its control solutions in sub-30 nm NAND flash devices
Il Han Park, Wook-Ghee Hahn, Ki-Whan Song, Ki Hwan Choi, Hyun-Ki Choi, Sung Bok Lee, Chang-Sub Lee, Jai Hyuk Song, Jin Man Han, Kye Hyun Kyoung, Young-Hyun Jun
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
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Conference Proceeding
A new approach of NAND flash cell trap analysis using RTN characteristics
Daewoong Kang, Sungbok Lee, Hyun-Mog Park, Dong-jun Lee, Jun Kim, Junho Seo, Chikyoung Lee, Cheol Song, Chang-Sub Lee, Hyungcheol Shin, Jaihyuk Song, Haebum Lee, Jeong-Hyuk Choi, Young-Hyun Jun
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
The Effect of Field Oxide Recess on Cell [V_{rm TH}] Distribution of @@inand@ Flash Cell Arrays
Park, Mincheol, Lee, Chang-Sub, Hur, Sung-Hoi, Kim, Keonsoo, Lee, Won-Seong
Published in IEEE electron device letters (01.09.2008)
Published in IEEE electron device letters (01.09.2008)
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Journal Article
The Effect of Field Oxide Recess on Cell [Formula Omitted] Distribution of nand Flash Cell Arrays
Park, Mincheol, Lee, Chang-Sub, Hur, Sung-Hoi, Kim, Keonsoo, Lee, Won-Seong
Published in IEEE electron device letters (01.09.2008)
Published in IEEE electron device letters (01.09.2008)
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Journal Article
The Effect of Field Oxide Recess on Cell V rm TH Distribution of nand Flash Cell Arrays
Park, Mincheol, Lee, Chang-Sub, Hur, Sung-Hoi, Kim, Keonsoo, Lee, Won-Seong
Published in IEEE electron device letters (01.01.2008)
Published in IEEE electron device letters (01.01.2008)
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Journal Article
Characterizing the current degradation of abnormally structured MOS transistors using a 3D Poisson solver
Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, GI-Young Yang, Young-Kwan Park, Jeong-Taek Kong
Published in Proceedings International Symposium on Quality Electronic Design (2002)
Published in Proceedings International Symposium on Quality Electronic Design (2002)
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Conference Proceeding
Hot-carrier energy distribution model and its application to the MOSFET substrate current
Chang-sub Lee, Gyoyoung Jin, Keun-ho Lee, Jeong-taek Kong, Won-seong Lee, Yong-han Rho, Kan, E.C., Dutton, R.W.
Published in International Conference on Simulation of Semiconductor Processes and Devices (2002)
Published in International Conference on Simulation of Semiconductor Processes and Devices (2002)
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Conference Proceeding
22-nm damascene gate MOSFET fabrication with 0.9 nm EOT and local channel implantation
Jeong-Dong Choe, Chang-Sub Lee, Sung-Ho Kim, Sung-Min Kim, Shin-Ae Lee, Chang-Woo Oh, Ju-Won Lee, You-Gyun Shin, Donggun Park, Kinam Kim
Published in 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) (2003)
Published in 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) (2003)
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Conference Proceeding
80 nm 512M DRAM with enhanced data retention time using partially-insulated cell array transistor (PiCAT)
KYOUNG HWAN YEO, CHANG WOO OH, CHOE, Jeong-Dong, KIM, Dong-Won, PARK, Donggun, KIM, Kinam, KIM, Sung-Min, KIM, Min-Sang, LEE, Chang-Sub, LEE, Sung-Young, MING LI, CHO, Hye-Jin, YOON, Eun-Jung, KIM, Sung-Hwan
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Conference Proceeding
Highly manufacturable sub-50 nm high performance CMOSFET using real damascene gate process
Chang-Woo Oh, Sung-Ho Kim, Chang-Sub Lee, Jeong-Dong Choe, Shin-Ae Lee, Sung-Young Lee, Kyung-Hwan Yeo, Hye-Jin Jo, Eun-Jung Yoon, Sang-Jin Hyun, Donggun Park, Kinam Kim
Published in 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) (2003)
Published in 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) (2003)
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Conference Proceeding
Electrical characterization of partially insulated MOSFETs with buried insulators under source/drain regions
Chang Woo Oh, Kyoung Hwan Yeo, Min Sang Kim, Chang-Sub Lee, Dong Uk Choi, Sung Hwan Kim, Sung-Young Lee, Sung-Min Kim, Jung-Dong Choe, Yong Kyu Lee, Eun-Jung Yoon, Ming Li, Sung Dae Suk, Dong-Won Kim, Donggun Park, Kinam Kim
Published in Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) (2004)
Published in Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) (2004)
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Conference Proceeding
80 nm 512M DRAM with enhanced data retention time using partially-insulated cell array transistor (PiCAT)
Kyoung Hwan Yeo, Chang Woo Oh, Sung-Min Kim, Min-Sang Kim, Chang-Sub Lee, Sung-Young Lee, Ming Li, Hye-Jin Cho, Eun-Jung Yoon, Sung-Hwan Kim, Jeong-Dong Choe, Dong-Won Kim, Donggun Park, Kinam Kim
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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Conference Proceeding
A characterization tool for current degradation effects of abnormally structured MOS transistors
Jin-Kyu Park, Chang-Hoon Choi, Young-Kwan Park, Chang-Sub Lee, Jeong-Taek Kong, Moon-Ho Kim, Kyung-Ho Kim, Taek-Soo Kim, Sang-Hoon Lee
Published in SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest (1997)
Published in SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest (1997)
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Conference Proceeding