Effects of interstitial oxygen defects at HfOxNy/Si interface on electrical characteristics of MOS devices
CHENG, Chin-Lung, LU, Chun-Yuan, CHANG-LIAO, Kuei-Shu, HUANG, Ching-Hung, WANG, Sheng-Hung, WANG, Tien-Ko
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Published in IEEE transactions on electron devices (2006)
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Improved Electrical Characteristics of Ge pMOSFETs With ZrO2/HfO2 Stack Gate Dielectric
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Published in IEEE electron device letters (01.01.2016)
Published in IEEE electron device letters (01.01.2016)
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Twin Thin-Film Transistor Nonvolatile Memory With an Indium-Gallium-Zinc-Oxide Floating Gate
Hung, Min-Feng, Wu, Yung-Chun, Chang, Jiun-Jye, Chang-Liao, Kuei-Shu
Published in IEEE electron device letters (01.01.2013)
Published in IEEE electron device letters (01.01.2013)
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An Ultralow EOT Ge MOS Device With Tetragonal HfO2 and High Quality HfxGeyO Interfacial Layer
Fu, Chung-Hao, Chang-Liao, Kuei-Shu, Liu, Li-Jung, Li, Chen-Chien, Chen, Ting-Ching, Cheng, Jen-Wei, Lu, Chun-Chang
Published in IEEE transactions on electron devices (01.08.2014)
Published in IEEE transactions on electron devices (01.08.2014)
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Electrical Characteristics and Thermal Stability of [Formula Omitted] Metal Gate Electrode for Advanced MOS Devices
Chang-Ta Yang, Chang-Ta Yang, Kuei-Shu Chang-Liao, Kuei-Shu Chang-Liao, Hsin-Chun Chang, Hsin-Chun Chang, Chung-Hao Fu, Chung-Hao Fu, Tien-Ko Wang, Tien-Ko Wang, Wen-Fa Tsai, Wen-Fa Tsai, Chi-Fong Ai, Chi-Fong Ai, Wen-Fa Wu, Wen-Fa Wu
Published in IEEE transactions on electron devices (01.11.2008)
Published in IEEE transactions on electron devices (01.11.2008)
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Detection of Stress-Induced Interface Trap Generation on High- k Gated nMOSFETs in Real Time by Stress-and-Sense Charge Pumping Technique
Lu, Chun-Chang, Chang-Liao, Kuei-Shu, Tsai, Fu-Huan, Li, Chen-Chien, Wang, Tien-Ko
Published in IEEE transactions on electron devices (01.05.2015)
Published in IEEE transactions on electron devices (01.05.2015)
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Reliability and Thermal Stability of Clustered Vertical Furnace-Grown SiO2 With HfxTayN Metal Gate for Advanced MOS Device Application
Kuei-Shu Chang-Liao, Kuei-Shu Chang-Liao, Chin-Lung Cheng, Chin-Lung Cheng, Chun-Yuan Lu, Chun-Yuan Lu, Bhabani Shankar Sahu, Bhabani Shankar Sahu, Tzu-Chen Wang, Tzu-Chen Wang, Tien-Ko Wang, Tien-Ko Wang, Shang-Feng Huang, Shang-Feng Huang, Wen-Fa Tsai, Wen-Fa Tsai, Chi-Fong Ai, Chi-Fong Ai
Published in IEEE transactions on electron devices (01.02.2007)
Published in IEEE transactions on electron devices (01.02.2007)
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Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High- k Gated MOSFETs by a Modified Charge Pumping Technique
Lu, Chun-Chang, Chang-Liao, Kuei-Shu, Tsao, Che-Hao, Wang, Tien-Ko, Ko, Hsueh-Chao, Hsu, Yao-Tung
Published in IEEE transactions on electron devices (01.04.2014)
Published in IEEE transactions on electron devices (01.04.2014)
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Enhanced Hole Mobility and Low Tinv for pMOSFET by a Novel Epitaxial Si/Ge Superlattice Channel
Fu, Chung-Hao, Chang-Liao, Kuei-Shu, Liu, Li-Jung, Hsieh, Hsiao-Chi, Lu, Chun-Chang, Li, Chen-Chien, Wang, Tien-Ko, Heh, Da-Wei
Published in IEEE electron device letters (01.02.2012)
Published in IEEE electron device letters (01.02.2012)
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Novel SONOS-Type Nonvolatile Memory Device With Optimal Al Doping in HfAlO Charge-Trapping Layer
Ping-Hung Tsai, Kuei-Shu Chang-Liao, Chu-Yung Liu, Tien-Ko Wang, Tzeng, P.J., Lin, C.H., Lee, L.S., Tsai, M.-J.
Published in IEEE electron device letters (01.03.2008)
Published in IEEE electron device letters (01.03.2008)
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