by Rakheja, Shaloo, Li, Kexin, Dowling, Karen M., Conway, Adam M., Voss, Lars F.
Published in IEEE journal of the Electron Devices Society (2021)

by Rakheja, S., Huang, L., Hau-Riege, Stefan, Harrison, S. E., Voss, Lars F., Conway, Adam M.
Published in IEEE journal of the Electron Devices Society (01.01.2020)

by Hall, David L., Voss, Lars F., Grivickas, Paulius, Bora, Mihail, Conway, Adam M., Scajev, Patrik, Grivickas, Vytautas
Published in IEEE electron device letters (01.07.2020)

by Bora, Mihail, Voss, Lars F., Grivickas, Paulius V., Hall, David L., Alameda, Jennifer B., Kramer, Noah J., Torres, Andrea M., Conway, Adam M.
Published in IEEE electron device letters (01.05.2019)

by Mazumder, Sudip K., Voss, Lars F., Dowling, Karen M., Conway, Adam, Hall, David, Kaplar, Robert J., Pickrell, Gregory W., Flicker, Jack, Binder, Andrew T., Chowdhury, Srabanti, Veliadis, Victor, Luo, Fang, Khalil, Sameh, Aichinger, Thomas, Bahl, Sandeep R., Meneghini, Matteo, Charles, Alain B.
Published in IEEE journal of emerging and selected topics in power electronics (01.08.2023)

by Hunt, Charles E., Carpenter, Arthur, Voss, Lars F., Scott, Robin C., Shao, Qinghui, Looker, Quinn, Garafalo, Anne, Mistyuk, Sergey, Durand, Cassandra, Kumar, Ankit, Stroud, Jean-Paul, van Benthem, Klaus
Published in IEEE transactions on electron devices (01.08.2020)

by Voss, Lars F., Qinghui Shao, Conway, Adam M., Reinhardt, Cathy E., Graff, Robert T., Nikolic, Rebecca J.
Published in IEEE electron device letters (01.10.2013)

by Mazumder, Sudip K., Voss, Lars F., Dowling, Karen, Conway, Adam, Hall, David, Kaplar, Robert J., Pickrell, Greg, Flicker, Jack, Binder, Andrew, Chowdhury, Srabanti, Veliadis, Victor, Luo, Fang, Khalil, Sameh, Aichinger, Thomas, Bahl, Sandeep, Meneghini, Matteo, Charles, Alain
Published in IEEE journal of emerging and selected topics in power electronics (18.05.2023)

by Rakheja, S., Huang, L., Hau-Riege, Stefan, Harrison, S. E., Voss, Lars F., Conway, Adam M.
Published in IEEE journal of the Electron Devices Society (01.01.2020)

by Harrison, Sara E., Shao, Qinghui, Frye, Clint D., Voss, Lars F., Nikolic, Rebecca J.
Published in 2018 76th Device Research Conference (DRC) (01.06.2018)

by Shao, Qinghui, Voss, Lars F., Murphy, John M., Frye, Clint D., Henderson, Roger A., Stoyer, Mark A., Qu, Dongxia, Nikolic, Rebecca J.
Published in 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) (01.10.2017)

by Murphy, John W., Frye, Clint D., Qian, Fang, Despotopulos, John D., Henderson, Roger A, Shao, Qinghui, Kazkaz, Kareem, Voss, Lars F., Nikolic, Rebecca J.
Published in 2018 76th Device Research Conference (DRC) (01.06.2018)

by Conway, A. M., Voss, L. F., Nelson, A. J., Beck, P. R., Laurence, T. A., Graff, R. T., Nikolic, R. J., Payne, S. A., Hadong Kim, Cirignano, L. J., Shah, Kanai
Published in IEEE transactions on nuclear science (01.04.2013)

by Voss, L. F., Conway, A. M., Nelson, A. J., Beck, P. R., Graff, R. T., Nikolic, R. J., Payne, S. A., Burger, A., Chen, H.
Published in IEEE transactions on nuclear science (01.04.2013)

by Kargar, Alireza, Tower, Joshua P., Huicong Hong, Cirignano, Leonard J., Hadong Kim, Beck, Patrick R., Conway, Adam M., Drury, Owen B., Voss, Lars F., Graff, Robert T., Nelson, A. J., Nikolic, Rebecca J., Payne, Stephen A., Badikov, V., Shah, Kanai
Published in 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC) (01.10.2012)

by Voss, L F, Conway, A M, Graff, R T, Beck, P R, Nikolic, R J, Nelson, A J, Payne, S A, Hadong Kim, Cirignano, L, Shah, K
Published in IEEE Nuclear Science Symposuim & Medical Imaging Conference (01.10.2010)

by Conway, A.M., Sturm, B.W., Voss, L.F., Beck, P.R., Graff, R.T., Nikolic, R.J., Nelson, A.J., Payne, S.A.
Published in 2009 International Semiconductor Device Research Symposium (01.12.2009)

by Khanna, R, Stafford, L, Voss, L F, Pearton, S J, Wang, H T, Anderson, T, Hung, Sheng-Chun, Ren, F
Published in IEEE transactions on device and materials reliability (01.06.2008)