Integrated HfO2-RRAM to achieve highly reliable, greener, faster, cost-effective, and scaled devices
ChiaHua Ho, Shuo-Che Chang, Chao-Yi Huang, Yu-Cheng Chuang, Seow-Fong Lim, Ming-Huei Hsieh, Shu-Cheng Chang, Hsiu-Han Liao
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
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