Interpretation of switching data in oxide resistive switching thin films
Yoo, In K., Kim, Jong W., Kim, Kwon Y.
Published in 2015 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF), International Symposium on Integrated Functionalities (ISIF), and Piezoelectric Force Microscopy Workshop (PFM) (01.05.2015)
Published in 2015 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF), International Symposium on Integrated Functionalities (ISIF), and Piezoelectric Force Microscopy Workshop (PFM) (01.05.2015)
Get full text
Conference Proceeding
Electron emission behaviors of ferroelectric materials
Sidorkin, V.A., Bourim, E.M., Kim, D.-W., Moon, C.W., Yoo, I.K.
Published in 4th IEEE International Conference on Vacuum Electronics, 2003 (2003)
Published in 4th IEEE International Conference on Vacuum Electronics, 2003 (2003)
Get full text
Conference Proceeding
Electrical Conduction Mechanisms of Barium-Titanate-Based Thick-Film Capacitors
In Yoo, Burton, L., Stephenson, F.
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.06.1987)
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.06.1987)
Get full text
Journal Article