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Physical and predictive models of ultrathin oxide reliability in CMOS devices and circuits
by
Stathis, J.H.
Published in
IEEE transactions on device and materials reliability
(01.03.2001)
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Introduction to the Special Issue on the 50th International Reliability Physics Symposium
by
Ogawa, Ennis T.
,
Chaparala, Prasad
,
Stathis
,
James H
.
,
Krishnan, Srikanth
Published in
IEEE transactions on device and materials reliability
(01.06.2013)
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Introduction to the Special Issue on the 2009 International Reliability Physics Symposium
by
Stathis
,
James H
.
,
Suehle, John H.
,
Lacoe, Ronald C.
,
Moore, Thomas M.
Published in
IEEE transactions on device and materials reliability
(01.12.2009)
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