Mitigation Technique for Single Event Transient via Pulse Quenching
Li, Hongchen, Xiao, Liyi, Li, Jie, Liu, He
Published in IEEE transactions on device and materials reliability (01.09.2021)
Published in IEEE transactions on device and materials reliability (01.09.2021)
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Magazine Article
A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance
Li, Jie, Xiao, Liyi, Li, Hongchen, Cao, Xuebing, Wang, Chenxu
Published in IEEE transactions on device and materials reliability (01.06.2022)
Published in IEEE transactions on device and materials reliability (01.06.2022)
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Magazine Article