Study of Defect Structures in 6H-SiC a/m-Plane Pseudofiber Crystals Grown by Hot-Wall CVD Epitaxy
Goue, Ouloide Y., Raghothamachar, Balaji, Yang, Yu, Guo, Jianqiu, Dudley, Michael, Kisslinger, Kim, Trunek, Andrew J., Neudeck, Philip G., Spry, David J., Woodworth, Andrew A.
Published in Journal of electronic materials (01.04.2016)
Published in Journal of electronic materials (01.04.2016)
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Mechanisms of Heavy Ion-Induced Single Event Burnout in 4H-SiC Power MOSFETs
McPherson, Joseph A., Hitchcock, Collin W., Ji, Wei, Woodworth, Andrew A., Chow, T. Paul
Published in Materials science forum (28.07.2020)
Published in Materials science forum (28.07.2020)
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Journal Article
Study of defect structures in 6H-SiC a/m-plane pseudofiber crystals grown by hot-wall CVD epitaxy
Goue, Ouloide Y., Raghothamachar, Balaji, Yang, Yu, Guo, Jianqiu, Dudley, Michael, Kisslinger, Kim, Trunek, Andrew J., Neudeck, Philip G., Spry, David J., Woodworth, Andrew A.
Published in Journal of electronic materials (25.11.2015)
Published in Journal of electronic materials (25.11.2015)
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Journal Article