Physical characterization of sub-32-nm semiconductor materials and processes using advanced ion beam-based analytical techniques
Hopstaken, M. J. P., Pfeiffer, D., Copel, M., Gordon, M. S., Ando, T., Narayanan, V., Jagannathan, H., Molis, S., Wahl, J. A., Bu, H., Sadana, D. K., Czornomaz, L., Marchiori, C., Fompeyrine, J.
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Published in Surface and interface analysis (01.01.2013)
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Conference Proceeding
Small silicon memories: confinement, single-electron,. and interface state considerations
Tiwari, S, Wahl, J A, Silva, H, Rana, F, Welser, J J
Published in Applied physics. A, Materials science & processing (01.10.2000)
Published in Applied physics. A, Materials science & processing (01.10.2000)
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Journal Article
Small silicon memories: confinement, single-electron,. and interface state considerations
Tiwari, S., Wahl, J.A., Silva, H., Rana, F., Welser, J.J.
Published in Applied physics. A, Materials science & processing (01.10.2000)
Published in Applied physics. A, Materials science & processing (01.10.2000)
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Journal Article
Small silicon memories : confinement, single-electron, and interface state considerations : Semiconductor nanostructures: fundamentals and applications
TIWARI, S, WAHL, J. A, SILVA, H, RANA, F, WELSER, J. J
Published in Applied physics. A, Materials science & processing (2000)
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Published in Applied physics. A, Materials science & processing (2000)
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Effect of water quality on the bonding of resin to moist dentin
Wahl, Andrew J, Combe, Edward C, Polack, Mariano A, Martens, Leslie V
Published in American journal of dentistry (01.04.2002)
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Published in American journal of dentistry (01.04.2002)
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SF system: Transistors, diodes and components
Wahl, A. J., McMahon, W., Lesh, N. G., Thompson, W. J.
Published in Bell System Technical Journal (06.05.1970)
Published in Bell System Technical Journal (06.05.1970)
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