Physics-based simulation techniques for small- and large-signal device noise analysis in RF applications
Bonani, F., Guerrieri, S.D., Ghione, G.
Published in IEEE transactions on electron devices (01.03.2003)
Published in IEEE transactions on electron devices (01.03.2003)
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Journal Article
Noise source modeling for cyclostationary noise analysis in large-signal device operation
Bonani, F., Guerrieri, S.D., Ghione, G.
Published in IEEE transactions on electron devices (01.09.2002)
Published in IEEE transactions on electron devices (01.09.2002)
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Bonani, F., Guerrieri, S.D., Ghione, G.
Published in IEEE transactions on electron devices (01.10.2003)
Published in IEEE transactions on electron devices (01.10.2003)
Get full text
Journal Article
Physics-based large-signal sensitivity analysis of microwave circuits using technological parametric sensitivity from multidimensional semiconductor device models
Bonani, F., Guerrieri, S.D., Filicori, F., Ghione, G., Pirola, M.
Published in IEEE transactions on microwave theory and techniques (01.05.1997)
Published in IEEE transactions on microwave theory and techniques (01.05.1997)
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Journal Article