by Burns, J.A., Aull, B.F., Chen, C.K., Chang-Lee Chen, Keast, C.L., Knecht, J.M., Suntharalingam, V., Warner, K., Wyatt, P.W., Yost, D.-R.W.
Published in IEEE transactions on electron devices (01.10.2006)

by Gouker, P. M., Tyrrell, B., D'Onofrio, R., Wyatt, P., Soares, T., Weilin Hu, Chenson Chen, Schwank, J. R., Shaneyfelt, M. R., Blackmore, E. W., Delikat, K., Nelson, M., McMarr, P., Hughes, H., Ahlbin, J. R., Weeden-Wright, S., Schrimpf, R.
Published in IEEE transactions on nuclear science (01.12.2011)

by Gouker, P. M., Tyrrell, B., Renzi, M., Chenson Chen, Wyatt, P., Ahlbin, J. R., Weeden-Wright, S., Atkinson, N. M., Gaspard, N. J., Bhuva, B. L., Massengill, L. W., Enxia Zhang, Schrimpf, R., Weller, R. A., King, M. P., Gadlage, M. J.
Published in IEEE transactions on nuclear science (01.12.2011)

by Fritze, M., Keast, C.L., Chen, C.K., Astolfi, D.K., Yost, D.R., Burns, J.A., Chang-Lee Chen, Gouker, P.M., Suntharalingam, V., Wyatt, P.W.
Published in IEEE circuits and devices magazine (01.01.2003)