Roles of the gate length and width of the transistors in increasing the single event upset resistance of SRAM cells
Zhongshan Zheng, Zhentao Li, Gengsheng Chen, Jiajun Luo, Zhengsheng Han
Published in 2017 IEEE 12th International Conference on ASIC (ASICON) (01.10.2017)
Published in 2017 IEEE 12th International Conference on ASIC (ASICON) (01.10.2017)
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Conference Proceeding
Neutron-induced single-event-transient effects in ultrathin-body fully-depleted silicon-on-insulator MOSFETs
Jinshun Bi, Reed, R. A., Schrimpf, R. D., Fleetwood, D. M., Zhengsheng Han
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
A new full current mode sense amplifier with compensation circuit
Yiqi Wang, Fazhao Zhao, Mengxin Liu, Zhengsheng Han
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
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Conference Proceeding
Effects of metal spacing and poly-silicon layers on pulsed-laser single event transient testing
Jinshun Bi, Chuanbin Zeng, Linchun Gao, Duoli Li, Gang Liu, Jiajun Luo, Zhengsheng Han, Zhengshen Han
Published in 2014 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2014)
Published in 2014 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2014)
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Conference Proceeding
Total dose effects of 28nm FD-SOI CMOS transistors
Kuang, Yong, Bu, Jianhui, Li, Bo, Gao, Linchun, Liang, Chunping, Han, Zhengsheng, Luo, Jiajun
Published in 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2018)
Published in 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2018)
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Conference Proceeding
Mitigation of soft errors in resistive switching random-access-memories
Jinshun Bi, Zhengsheng Han
Published in 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (01.06.2014)
Published in 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (01.06.2014)
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Conference Proceeding
A simulation model for the PN junction based on SOI
Jianhui Bu, Ying Li, Jiajun Luo, Zhengsheng Han
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
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Conference Proceeding
Analysis and optimization of tunneling-FET based on SOI
Li Ying, Bu Jianhui, Luo Jiajun, Han Zhengsheng
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
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Conference Proceeding
SRAM-Based PUF with Noise Immunity Achieving 0.58% Native BER in 55-nm CMOS
Su, Zexin, Li, Bo, Liu, Chang, Su, Xiaohui, Luo, Qian, Ren, Hongyu, Han, Zhengsheng
Published in 2024 IEEE International Symposium on Circuits and Systems (ISCAS) (19.05.2024)
Published in 2024 IEEE International Symposium on Circuits and Systems (ISCAS) (19.05.2024)
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Conference Proceeding
System Analysis and PHM Methods for Power Devices Based on Physics-of-Failure
Yulong Zhang, Lulu Wang, Bo Gao, Lixin Wang, Jiajun Luo, Zhengsheng Han
Published in 2017 International Conference on Dependable Systems and Their Applications (DSA) (01.10.2017)
Published in 2017 International Conference on Dependable Systems and Their Applications (DSA) (01.10.2017)
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Conference Proceeding
3-D Geant4 simulation of deep sub-micron SOI SRAM irradiated by proton
Shuo Guo, Jinshun Bi, Jiajun Luo, Zhengsheng Han
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding
Body Bias Effects on the Single-Event-Transient Response of PDSOI Devices
Jinshun Bi, Li Chen, Zhengsheng Han, Yan Wang, Ming Liu
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
Study of RBSOA reliability of nanoscale Partially Narrow Mesa IGBT (PNM-IGBT)
Jiang Lu, Hainan Liu, Jiajun Luo, Lixin Wang, Guohuan Zhang, Zhengsheng Han
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
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Conference Proceeding
Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET
Zhang, Xinyi, Wang, Kewei, Wang, Fang, Li, Jiangjiang, Wu, Zhicheng, Li, Duoli, Li, Bo, Bu, Jianhui, Han, Zhengsheng
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Failure analysis of the VDMOS device with Vsd and Rds (on) exceeded limit based on reliability physics
Qing Li, Bo Gao, Haitao Deng, Lulu Wang, Dandan Yang, Lixin Wang, Jiajun Luo, Zhengsheng Han
Published in 2016 Prognostics and System Health Management Conference (PHM-Chengdu) (01.10.2016)
Published in 2016 Prognostics and System Health Management Conference (PHM-Chengdu) (01.10.2016)
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Conference Proceeding
The Effects of \gamma Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology
Wang, Yuchong, Chen, Siyuan, Liu, Fanyu, Li, Bo, Li, Jiangjiang, Huang, Yang, Zhang, Tiexin, Zhang, Xu, Han, Zhengsheng, Ye, Tianchun, Wan, Jing
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
3D TCAD simulation of single-event-effect in n-channel transistor based on deep sub-micron fully-depleted silicon-on-insulator technology
Jinshun Bi, Bo Li, Zhengsheng Han, Jiajun Luo, Li Chen, Xuefang Lin-Shi
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding
A digital direct controller for buck converter
Bo Li, Jinshun Bi, Zhengsheng Han, Jiajun Luo, Xuefang Lin-Shi, Allard, Bruno, Li Chen
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding
Single event transients in PDSOI CMOS inverter chain irradiated by pulsed laser
Xing Zhao, Bo Mei, Jinshun Bi, Zhongshan Zheng, Linchun Gao, Chuanbin Zeng, Jiajun Luo, Fang Yu, Zhengsheng Han
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding