Analog/RF wonderland: Circuit and technology co-optimization in advanced FinFET technology
Fu-Lung Hsueh, Yung-Chow Peng, Chung-Hui Chen, Tzu-Jin Yeh, Hsieh-Hung Hsieh, Chin-Ho Chang, Szu-Lin Liu, Mei-Chen Chuang, Chen, Mark
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)
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Conference Proceeding
A V-band divide-by-three differential direct injection-locked frequency divider in 65-nm CMOS
Hsieh-Hung Hsieh, Fu-Lung Hsueh, Chewn-Pu Jou, Kuo, Fred, Chen, Sean, Tzu-Jin Yeh, Tan, Kevin Kai-Wen, Po-Yi Wu, Yu-Ling Lin, Ming-Hsien Tsai
Published in IEEE Custom Integrated Circuits Conference 2010 (01.09.2010)
Published in IEEE Custom Integrated Circuits Conference 2010 (01.09.2010)
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Conference Proceeding
High-performance integrated fan-out wafer level packaging (InFO-WLP): Technology and system integration
Liu, C. C., Shuo-Mao Chen, Feng-Wei Kuo, Huan-Neng Chen, En-Hsiang Yeh, Cheng-Chieh Hsieh, Li-Hsien Huang, Ming-Yen Chiu, Yeh, J., Tsung-Shu Lin, Tzu-Jin Yeh, Shang-Yun Hou, Jui-Pin Hung, Jing-Cheng Lin, Chewn-Pu Jou, Chuei-Tang Wang, Shin-Puu Jeng, Yu, D. C. H.
Published in 2012 International Electron Devices Meeting (01.12.2012)
Published in 2012 International Electron Devices Meeting (01.12.2012)
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Band-pass filter co-designed with ESD protection using integrated passive device technology
Ming-Hsien Tsai, Jun-De Jin, Tzu-Jin Yeh, Chewn-Pu Jou, Liu, Sally, Fu-Lung Hsueh
Published in 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) (01.05.2015)
Published in 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) (01.05.2015)
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Conference Proceeding
A V-band low-noise amplifier with 5.3-dB NF and over 8-kV ESD protection in 65-nm RF CMOS
Tsai, Ming-Hsien, Hsu, Shawn S. H., Yeh, Tzu-Jin, Jou, Chewn-Pu, Hsueh, Fu-Lung
Published in 2012 IEEE/MTT-S International Microwave Symposium Digest (01.06.2012)
Published in 2012 IEEE/MTT-S International Microwave Symposium Digest (01.06.2012)
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Conference Proceeding
A 24-GHz low-noise amplifier co-designed with ESD protection using junction varactors in 65-nm RF CMOS
Ming-Hsien Tsai, Hsu, Shawn S. H., Fu-Lung Hsueh, Chewn-Pu Jou, Tzu-Jin Yeh, Jun-De Jin, Hsieh-Hung Hsieh
Published in 2011 IEEE MTT-S International Microwave Symposium (01.06.2011)
Published in 2011 IEEE MTT-S International Microwave Symposium (01.06.2011)
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An ultra-low power K-band low-noise amplifier co-designed with ESD protection in 40-nm CMOS
Ming-Hsien Tsai, Hsu, S S H, Fu-Lung Hsueh, Chewn-Pu Jou, Tzu-Jin Yeh, Ming-Hsiang Song, Jen-Chou Tseng
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding
A 56-67 GHz low-noise amplifier with 5.1-dB NF and 2.5-kV HBM ESD protection in 65-nm CMOS
Ming-Hsien Tsai, Hsieh-Hung Hsieh, Chun-Yu Lin, Li-Wei Chu, Hsu, Shawn S. H., Jun-De Jin, Tzu-Jin Yeh, Chewn-Pu Jou, Fu-Lung Hsueh, Ming-Dou Ker
Published in 2012 Asia Pacific Microwave Conference Proceedings (01.12.2012)
Published in 2012 Asia Pacific Microwave Conference Proceedings (01.12.2012)
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Conference Proceeding
A 0.011-mm227.5-GHz VCO with Transformer-Coupled Bandpass Filter Achieving -191 dBc/Hz FoM in 16-nm FinFET CMOS
Lin, Chi-Hsien, Lu, Ying-Ta, Liao, Hsien-Yuan, Chen, Sean, S. Loke, Alvin L., Yeh, Tzu-Jin
Published in 2020 IEEE/MTT-S International Microwave Symposium (IMS) (01.08.2020)
Published in 2020 IEEE/MTT-S International Microwave Symposium (IMS) (01.08.2020)
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Conference Proceeding
A performance study of layout and Vt options for low noise amplifier design in 65-nm CMOS
Quan Pan, Tzu-Jin Yeh, Chewnpu Jou, Fu-Lung Hsueh, Luong, H., Yue, C. P.
Published in 2012 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2012)
Published in 2012 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2012)
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Conference Proceeding
Ion-implanted GaAs MESFET's with W/WN/sub x/ bi-layer gate designs
Tzu-Jin Yeh, Yi-Jen Chan, Tien-Huat Gan
Published in International Electron Devices and Materials Symposium (1994)
Published in International Electron Devices and Materials Symposium (1994)
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